GINESTRA™ Solution The MDLab disruptive software

Ginestra™ is the ideal tool for accelerating technology development of novel devices and advanced materials.

 

GINESTRA™ software package is a unique simulation tool dedicated to the interpretation of electrical characterization measurements (I-V, C-V, G-V, Charge Pumping, Gate/Drain Noise, Bias Temperature Instabilities, Electrical stresses) and the reliability assessment of semiconductor devices with a focus on dielectric materials and interfaces.

The core of the simulation package is the atomic material-related physical description of charge and ion transport in dielectric stacks including interfaces, substrate and electrodes. The software relies on advanced models accounting for power dissipation, temperature increase and structural modification of the materials.

 

 

 Main Features

 

 

 

Module description

 

 

 Main Advantages

Reliability

IMPROVE THE DEVICE AND MATERIAL RELIABILITY

Business Improvement

REDUCE THE TIME-TO-MARKET and TECHNOLOGY DEVELOPMENT COSTS

Product Innovation

OPTIMIZE A NOVEL CLASS OF DEVICES WITH MIXED ELECTRONIC/ IONIC TRASPORT

Quality Assessment

ENABLE THE AUTOMATIC PRODUCT AND MATERIAL QUALITY MONITORING, THE DEFECT SPECTROSCOPY AND ROOT CAUSE ANALISYS